TDI, Inc. announces
a product sale to mark the Company’s 10th anniversary!

 

We are happy to provide 10% discount for any order of TDI current products received by TDI from August 10 to September 10, 2007.


Please contact us for details! 

 

TDI, Inc. supplies a variety of semiconductor engineering substrates (templates) for GaN and AlGaN epitaxial growth by MBE & MOCVD

  • GaN-on-sapphire
  • AlN-on-sapphire
  • AlGaN-on-sapphire
  • GaN-on-SiC
  • AlN-on-SiC
  • InN on GaN/Sapphire

These templates are excellent materials for production, product development and fundamental research enabling new applications including Ultra High Power HEMTs, High Brightness LEDs using Laser Lift Off, 250 – 400 nm UV emitters and detectors.

For more details on specifications and parameters visit www.tdii.com

All these materials are grown by Hydride Vapor Phase Epitaxy (HVPE) at TDI, Inc. TDI will report recent progress and future horizons of industrial HVPE technology and equipment and novel nitride semiconductor materials at the 4th China International Forum & Exhibition on Solid State Lighting 2007, August 22-24, Shanghai and the 7th International Conference Nitride Semiconductors, Las Vegas, September 16-21, 2007.

Customers satisfaction in semiconductor materials is our primary concern.  TDI sales

 

 

 

Parameter

Type of template

GaN-on-sapphire

AlN-on-sapphire

AlGaN-on-sapphire

AlN-on-SiC

Layer

GaN

AlN

AlGaN

5 – 85 % AlN

AlN

Layer thickness, microns

1 - 45

0.2 - 7

0.2 – 0.8

10 - 20

Substrate

2-, 3-, and 4-inch sapphire

2-inch sapphire

2-inch sapphire

2- 3- and 4-inch 6H- or 4H-SiC; conducting

Layer doping

Undoped, Si, Mg, Zn

-

Undoped, Si

-

Concentration

|Nd-Na|, cm-3

1015 – 1018

-

Depends on AlN %

-

Electrical conductivity

n-type, p-type, high resistivity

Insulating

n-type or insulating

Insulating

Layer surface

As grown

As grown

As grown

As grown rough Polished

As grown smooth

UV transparency

Transparent for

> 365 nm

Transparent for

> 200 nm

Depends on AlN %

Transparent for

> 200 nm

 

 

 

InN on GaN/Sapphire

(pilot production of research samples)

Parameter

Value/Description

Typical thickness of InN, microns

0.1 – 0.5

Initial substrate

C-plane sapphire, 2-inch

Electrical conductivity of InN

n-type

GaN layer thickness, microns

3-20

 

  

 

  

 

For all inquiries, please contact welcome@tdii.com

Technologies and Devices International, Inc.
12214 Plum Orchard Dr., Silver Spring, MD 20904 USA

TEL: +1 301 572 7834; FAX: +1 301 572 6435;   www.tdii.com


If you are not interested in receiving further offers from TDI, please send a blank e-mail to remove@tdii.com with the word "remove" in the subject field. If your current address differs from the address that this letter was sent to, please insert this address into the body of the letter.