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Aluminum
Gallium Nitride on Sapphire template |
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Excellent substrate for UV optoelectronics devices
Schematic cross section of AlGaN/Sapphire template |
AlGaN Material parameters
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Template type |
30 |
70 |
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AlGaN composition, mol.% |
5% - 60% |
60% - 85% |
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Thickness of AlGaN layer, microns |
0.2-0.8 |
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Electrical conductivity |
n-type for <35 mol.% |
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Initial substrate |
c-plane sapphire |
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Diameter, inch |
2 and 3 |
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Surface of AlGaN |
As grown |
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Optical transparency |
UV transparncy depends on alloy composition |
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Exclusion area |
2 mm periphery
region |
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Two types of templates are available: 1. Standard grade,
usable area >90% 2. Research grade,
usable area >80% Research grade templates are supplied at reduced price subject of availability. Contact TDI for additional information, prices and availability of templates User benefits to use AlGaN templates ·
Start growth
on native AlGaN surface ·
Simplify nucleation process (no buffer layer is
needed)
·
Reduce defect density in
device structure ·
Improve device parameters ·
Increase epi
productivity on existing growth equipment ·
Reduce epi
cost via throughput and yield increase ·
Reduce maintenance cost ·
Avoid possible
patent contest issues related to buffer layer |
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Optical transmission spectra measured for AlGaN, GaN and AlN templates
grown by HVPE at TDI |
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Copyright (c)
1997-2006 by TDI, Inc. |