a-plane GaN layers are grown
on r-plane sapphire
by hydride vapor
phase epitaxy (HVPE)

Undoped a-GaN template. Typical
Properties.
|
Template type |
5a |
Average thickness of GaN,
microns
|
2
- 5 |
|
FWHM
of x-ray RC omega-scan (00.2), arc sec |
<1000 |
|
Doping |
undoped |
|
GaN
Conductivity |
n-type |
|
Thickness
standard deviation |
<10% |
Sapphire substrate
|
r-plane, single side polished |
|
Diameter,
inch |
2 |
|
Surface
of GaN |
As grown or polished |
|
GaN
orientation |
a-plane |


Figure 1. Cross-sectional
(bottom) of a-plane GaN
layer grown by HVPE on r-plane sapphire.


Figure 2. X-ray 2q/w
scan (top) and w
scan x-ray diffraction (11-20)
rocking curve (bottom) for a-plane GaN layer grown on r-plane
sapphire.